AFM-IR device compatible with sub 10 nm.
Original PiFM AFM for nanoscale IR chemical analysis
Achieve sub-10 nm PiFM chemical mapping. It is possible to obtain detailed nanoscale chemical mapping and point spectra that are more precise than FTIR and nano FTIR. PiF IR spectra can be scanned at the fastest speed of 100 milliseconds per point, allowing for measurements to be taken in a short time.
- Company：日本レーザー
- Price：Other
